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Effects of EMC Degradation on Viscoelastic Properties and Reliability in Power Semiconductor Packages
- Authors
- 김학성
- Issue Date
- 12-Nov-2025
- Place
- 파라다이스호텔, 부산
- Conference Name
- The 4th Korean International Semiconductor Conference & Exhibition on Manufacturing Technology
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Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
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Related Researcher
- Kim, Hak Sung
- COLLEGE OF ENGINEERING (SCHOOL OF MECHANICAL ENGINEERING)