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2차원 나노물질의 표준 측정 분석법 개발
- Authors
- 정문석
- Issue Date
- 7-Nov-2025
- Place
- 대전 KW 컨벤션센터
- Conference Name
- 제 4회 한국표면분석학회 종합학술대회
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Jeong, Mun Seok
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)