Investigation of an erasing method for synaptic behaviour in a phase change device using Ge₁Cu₂Te₃ (GCT)
- Authors
- An, Jun Seop; Choi, Chul Min; Shindo, Satoshi; Sutou, Yuji; Jeong, Hong Sik; Song, Yun Heub
- Issue Date
- Sep-2016
- Publisher
- Institute of Electrical Engineers
- Citation
- Electronics Letters, v.52, no.18, pp 1514 - 1515
- Pages
- 2
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- Electronics Letters
- Volume
- 52
- Number
- 18
- Start Page
- 1514
- End Page
- 1515
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/22223
- DOI
- 10.1049/el.2016.2211
- ISSN
- 0013-5194
1350-911X
- Abstract
- The gradual erasing operation from reset state to set state adjusting pulse amplitude, duration time and falling time respectively in phase change device using Ge₁Cu₂Te₃ is investigated. For this procedure, a relatively high voltage and increased falling time, which was able to produce both long-term potential and long-term depression in the time interval between pre-spike and post-spike is choosing. The results suggested that the presence of synaptic behaviour was due to controlled falling time rather than pulse amplitude.
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