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Effect of Misfit Dislocations in Junctions and Base Thickness on Latch-up Characteristics in Two-Terminal Vertical Thyristor-Based Capacitorless Memory
- Authors
- 김은규
- Issue Date
- 2-Oct-2018
- Publisher
- AiMES Committee
- Citation
- Americas International Meeting on Electrochemistry and Solid State Science (AiMES) 2018
- Conference Name
- Americas International Meeting on Electrochemistry and Solid State Science (AiMES) 2018
- Place
- Cancun Mexico
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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