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Thin-oxide Z2-FET Reliability
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 안진호 | - |
| dc.date.accessioned | 2021-08-02T21:51:16Z | - |
| dc.date.available | 2021-08-02T21:51:16Z | - |
| dc.date.issued | 2018-03-19 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/29437 | - |
| dc.title | Thin-oxide Z2-FET Reliability | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon | - |
| dc.citation.conferencePlace | University of Granada | - |
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Related Researcher
- Ahn, Jinho
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)