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Thin-oxide Z2-FET Reliability
- Authors
- 안진호
- Issue Date
- 19-Mar-2018
- Place
- University of Granada
- Conference Name
- Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Ahn, Jinho
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)