Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Evaluation of interface trap density between MoS2 layer and dielectrics in suspended MoS2 transistor
- Authors
- 김은규
- Issue Date
- 24-Apr-2015
- Publisher
- 한국물리학회
- Citation
- 2015년 한국물리학회 봄학술논문발표회
- Conference Name
- 2015년 한국물리학회 봄학술논문발표회
- Place
- 대전컨벤션센터
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.