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Modelling of Phase Change Memory(PCM) cell for Circuit Simulation

Authors
Kweon, Jun-YoungSong, Yun-HeupKim, Tony Tae-Hyoung
Issue Date
Oct-2019
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Modelling; OTS; PCM; PRAM
Citation
Proceedings - 2019 International SoC Design Conference, ISOCC 2019, pp.170 - 171
Indexed
SCOPUS
Journal Title
Proceedings - 2019 International SoC Design Conference, ISOCC 2019
Start Page
170
End Page
171
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4524
DOI
10.1109/ISOCC47750.2019.9027691
ISSN
2163-9612
Abstract
PRAMs with PCM and OTS have been reported and applied for the crossbar array structure. The characteristics of PCM and OTS have significant effects on the PRAM operation. This paper introduces a novel PCM, and OTS macro-model based on the physical mechanisms of them and CMOS based OTS operation mimicking circuitry for chip demonstration. PCM/OTS macro modelling allows designers to understand the device behaviour at developing of cell operating system and OTS mimicking circuitry helps test for demonstration chip evaluation.
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