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Thermal Stability of Single and Alloy Noble Metals as for PMOS Gate Electrode
- Authors
- 최창환
- Issue Date
- 29-Sep-2011
- Publisher
- The Japan Society of Applied Physics
- Citation
- International Conference on Solid State Devices and Materials (SSDM)
- Conference Name
- International Conference on Solid State Devices and Materials (SSDM)
- Place
- Nagoya, Japan
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Choi, Chang hwan
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)