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Effect fo the interface carrier density on the device property fo the ZnO thin film transistor fabricated by Atomic Layer Deposition method
- Authors
- 전형탁
- Issue Date
- 20090608
- Place
- congress center strasbourg, France
- Conference Name
- E-MRS 2009 Spring Meeting
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Jeon, Hyeongtag
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)