Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Thermal stability and Electrical Charcteristics of Lanthanum-Aluminum Oxide films annealed in va-cuum and N2 ambient
- Authors
- 전형탁
- Issue Date
- 20090608
- Place
- congress center strasbourg, France
- Conference Name
- E-MRS 2009 Spring Meeting
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Jeon, Hyeongtag
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)