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Memory characteristics of Cobalt-Silicide nanocrystals embedded in HfO2 gate oxide for nonvoltiel flash devices
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍진표 | - |
| dc.date.accessioned | 2021-08-04T00:22:00Z | - |
| dc.date.available | 2021-08-04T00:22:00Z | - |
| dc.date.issued | 20080214 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/65486 | - |
| dc.description.abstract | 1 | - |
| dc.title | Memory characteristics of Cobalt-Silicide nanocrystals embedded in HfO2 gate oxide for nonvoltiel flash devices | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 한국진공학회 동계정기학술대회 | - |
| dc.citation.conferencePlace | 단국대학교 죽전캠퍼스 | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)