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Memory characteristics of Cobalt-Silicide nanocrystals embedded in HfO2 gate oxide for nonvoltiel flash devices
- Authors
- 홍진표
- Issue Date
- 20080214
- Place
- 단국대학교 죽전캠퍼스
- Conference Name
- 한국진공학회 동계정기학술대회
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)