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Analysis of 6H-SiC Surface under Various Chemical Etching Conditions by Using AFM
- Authors
- 김용균
- Issue Date
- 27-Oct-2007
- Place
- HILTON Hawaiian Village Beach Resort, Honolulu, Hawaii, USA
- Conference Name
- Nuclear Science Symposium and Medical Imaging Conference
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Collections - 서울 공과대학 > 서울 원자력공학과 > 2. Conference Papers
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Related Researcher
- Kim, Yong Kyun
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)