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Characterization of Low Temperature Radical Oxidation to Tunnel Oxide Flash Memory
- Authors
- 안진호
- Issue Date
- 20040901
- Place
- 동북학원대학,Japan
- Conference Name
- 제65회 응용물리학외학술강연회
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Ahn, Jinho
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)