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Optimal Design of Accelerated Life Tests for One-Shot Devices
- Authors
- 배석주
- Issue Date
- 23-Aug-2020
- Place
- Vancouver
- Conference Name
- APARM 2020
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)