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시계열 데이터의 Denoising CNN 적용을 통한 물리 모델 기반의 고장 진단 및 잔여수명 추정

Authors
배석주
Issue Date
23-Jul-2020
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/8688
Place
더케이호텔 서울
Conference Name
PHM Korea 2020
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서울 공과대학 > 서울 산업공학과 > 2. Conference Papers

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COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)
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