DOAJ | 2019-2021 |
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OA | ![]() based on the information
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Keywords | extreme manufacturing, micro/nano metrology, ultrahigh precision manufacturing, complex systems, materials science, atomic level control |
Review Process | Blind peer review |
Journal info. pages | |
Licences | CC BY |
Copyrights | Yes |
DOAJ Coverage |
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Subject(s) | Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials | Technology: Technology (General): Industrial engineering. Management engineering | Science: Physics |