Impedance Spectroscopy Characterization in Bipolar Ta/MnOx/Pt Resistive Switching Thin Films
- Authors
- Park, Chan-Rok; Choi, Sun-Young; You, Yil-Hwan; Yang, Min Kyu; Bae, Seung-Muk; Lee, Jeon-Kook; Hwang, Jin-Ha
- Issue Date
- Apr-2013
- Publisher
- WILEY
- Citation
- JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.96, no.4, pp.1234 - 1239
- Journal Title
- JOURNAL OF THE AMERICAN CERAMIC SOCIETY
- Volume
- 96
- Number
- 4
- Start Page
- 1234
- End Page
- 1239
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/17158
- DOI
- 10.1111/jace.12185
- ISSN
- 0002-7820
- Abstract
- Impedance spectroscopy was applied to MnOx-based thin films prepared in symmetric and asymmetric electrode configurations, i.e., Pt/MnOx/Pt and Ta/MnOx/Pt, respectively. Equivalent circuit analysis suggests the presence of higher resistance surface layers adjacent the electrodes, in addition to a higher conductivity component at central portions of the MnOx thin films. The asymmetric configuration enables the Ta/MnOx interfacial layer to facilitate the redox transport of oxygen ions, where significant changes in resistance with the electric field are responsible for the higher on/off resistance ratio in Ta/MnOx/Pt. The higher dielectric constant and bias-dependent capacitance and resistance support the coexistence of both oxidized surfaces and interfacial layers.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Materials Science and Engineering Major > 1. Journal Articles
![qrcode](https://api.qrserver.com/v1/create-qr-code/?size=55x55&data=https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/17158)
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.