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Inverse relationship between exo-electron currents and statistical delay of AC PDPs
- Authors
- Kuang, Y.; Choi, K.-H.; Kim, Y.-S.
- Issue Date
- 2010
- Citation
- IDW'10 - Proceedings of the 17th International Display Workshops, v.2, pp.961 - 962
- Journal Title
- IDW'10 - Proceedings of the 17th International Display Workshops
- Volume
- 2
- Start Page
- 961
- End Page
- 962
- ISSN
- 0000-0000
- Abstract
- A relationship between exo-electron current and statistical relationship was examined on AC PDP test panels with or without MgO nano-crystals sprayed on MgO layer. The results indicated that the statistical delay is inversely proportional to exo-electron currents, but its proportional constant varies significantly, depending on the presence of MgO nano-crystals. © 2010 ITE and SID.
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