Electrical/Microstructural Characterization of Dielectric Thin Films Prepared on Transparent Substrates
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 유일환 | - |
dc.contributor.author | 황진하 | - |
dc.date.accessioned | 2022-01-13T08:42:31Z | - |
dc.date.available | 2022-01-13T08:42:31Z | - |
dc.date.created | 2022-01-04 | - |
dc.date.issued | 2008 | - |
dc.identifier.issn | 1738-2270 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/23309 | - |
dc.description.abstract | Pb(ZrTi)O3 thin films were prepared on transparent conducting oxides, through sol-gel processing. The processing variables such as spin velocity, spin time and annealing temperature were investigated using a statistical design of experiments. Dielectric properties were determined through capacitance-voltage measurements and electrical characterizations evaluated using current-voltage characteristics. The leakage current is determined mainly by annealing. The capacitance and breakdown voltage is found to be independent of the processing variables. The sophisticatedly controlled PZT thin films have been confirmed through microscopic image. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | 한국반도체디스플레이기술학회 | - |
dc.title | Electrical/Microstructural Characterization of Dielectric Thin Films Prepared on Transparent Substrates | - |
dc.title.alternative | Electrical/Microstructural Characterization of Dielectric Thin Films Prepared on Transparent Substrates | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 황진하 | - |
dc.identifier.bibliographicCitation | 반도체디스플레이기술학회지, v.7, no.1, pp.53 - 57 | - |
dc.relation.isPartOf | 반도체디스플레이기술학회지 | - |
dc.citation.title | 반도체디스플레이기술학회지 | - |
dc.citation.volume | 7 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 53 | - |
dc.citation.endPage | 57 | - |
dc.type.rims | ART | - |
dc.identifier.kciid | ART001242708 | - |
dc.description.journalClass | 2 | - |
dc.description.journalRegisteredClass | kci | - |
dc.description.journalRegisteredClass | other | - |
dc.subject.keywordAuthor | Pb(ZrTi)O3 | - |
dc.subject.keywordAuthor | Dielectric Properties | - |
dc.subject.keywordAuthor | Electrical Properties | - |
dc.subject.keywordAuthor | Annealing Temperature. | - |
dc.subject.keywordAuthor | Pb(ZrTi)O3 | - |
dc.subject.keywordAuthor | Dielectric Properties | - |
dc.subject.keywordAuthor | Electrical Properties | - |
dc.subject.keywordAuthor | Annealing Temperature. | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
94, Wausan-ro, Mapo-gu, Seoul, 04066, Korea02-320-1314
COPYRIGHT 2020 HONGIK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.