Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Optical Effect due to Thickness Variation of Electron Injection Layer in Organic Light-emitting DiodesOptical Effect due to Thickness Variation of Electron Injection Layer in Organic Light-emitting Diodes

Other Titles
Optical Effect due to Thickness Variation of Electron Injection Layer in Organic Light-emitting Diodes
Authors
Young-Hwan LeeKang-Won LeeKeon-Young YiJin-Woong HongTae Wan Kim
Issue Date
2008
Publisher
한국전기전자재료학회
Keywords
OLEDs; Current density; Luminance; LiF layer; Thickness variation; Luminance efficiency
Citation
Transactions on Electrical and Electronic Materials, v.9, no.1, pp.20 - 23
Journal Title
Transactions on Electrical and Electronic Materials
Volume
9
Number
1
Start Page
20
End Page
23
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/23404
ISSN
1229-7607
Abstract
Organic light-emitting diodes (OLEDs) are attractive because of possible application in display with low-operating voltage, low-power consumption, self-emission and capability of multicolor emission by the selection of emissive materials. To investigated the optical effects, we studied the electrical and optical characteristics due to thickness variation of electron injection materials LiF on organic light-emitting diodes in the ITO (indium-tin-oxide)/N,N'-diphenyl-N,N'-bis(3-methyphenyl)-1,1'-biphenyl-4,4'-diamine(TPD)/tris(8-hydroxyquinoline) aluminum (Alq₃)/LiF layer/Al device. We maintained the thicknesses of TPD and Alq₃ layers at 40 nm and 60 nm, respectively. The deposition rates of TPD and Alq3 were in the 1.5 Å/s under a base pressure of 5x10-6 Torr. It was found that luminance and luminous efficiency of the device with 0.7 nm LiF layer improve 25 times and 7 times than the device without the LiF layer, respectively.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Science > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Tae Wan photo

Kim, Tae Wan
Engineering (Applied Science)
Read more

Altmetrics

Total Views & Downloads

BROWSE