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Bump formation and flip chip processes for RF system-on-packages

Authors
Jung, B.-Y.Choi, E.-K.Jeon, Y.-S.Lee, K.-Y.Seo, K.-K.Oh, T.-S.
Issue Date
2007
Publisher
Trans Tech Publications Ltd
Keywords
Bump; Electronic package; Flip chip; RF package; SOP
Citation
Solid State Phenomena, v.124-126, no.PART 1, pp.25 - 28
Journal Title
Solid State Phenomena
Volume
124-126
Number
PART 1
Start Page
25
End Page
28
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/24213
DOI
10.4028/3-908451-31-0.25
ISSN
1012-0394
Abstract
For flip-chip process of RF system-on-packages(SOP), double bump bonding processes were investigated. Sn-Ag and Sn solder joints were formed by the reflowed double bumping process, and Sn/In/Sn bump joints were fabricated by the non-reflowed double bump bonding process. The height-to-size ratios of 0.78 and 0.65 were obtained for the reflowed double bumping and the non-reflowed bumping, respectively. Average contact resistance of the reflowed Sn-Ag and Sn solder joints was about 13mΩ which was much lower than 24-33mΩ of the non-reflowed Sn/In/Sn bump joints. The reflowed solder double bumping method is more suitable for flip-chip process of RF-SOP than the non-reflowed double bump bonding.
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