Bump formation and flip chip processes for RF system-on-packages
- Authors
- Jung, B.-Y.; Choi, E.-K.; Jeon, Y.-S.; Lee, K.-Y.; Seo, K.-K.; Oh, T.-S.
- Issue Date
- 2007
- Publisher
- Trans Tech Publications Ltd
- Keywords
- Bump; Electronic package; Flip chip; RF package; SOP
- Citation
- Solid State Phenomena, v.124-126, no.PART 1, pp.25 - 28
- Journal Title
- Solid State Phenomena
- Volume
- 124-126
- Number
- PART 1
- Start Page
- 25
- End Page
- 28
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/24213
- DOI
- 10.4028/3-908451-31-0.25
- ISSN
- 1012-0394
- Abstract
- For flip-chip process of RF system-on-packages(SOP), double bump bonding processes were investigated. Sn-Ag and Sn solder joints were formed by the reflowed double bumping process, and Sn/In/Sn bump joints were fabricated by the non-reflowed double bump bonding process. The height-to-size ratios of 0.78 and 0.65 were obtained for the reflowed double bumping and the non-reflowed bumping, respectively. Average contact resistance of the reflowed Sn-Ag and Sn solder joints was about 13mΩ which was much lower than 24-33mΩ of the non-reflowed Sn/In/Sn bump joints. The reflowed solder double bumping method is more suitable for flip-chip process of RF-SOP than the non-reflowed double bump bonding.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Materials Science and Engineering Major > 1. Journal Articles
![qrcode](https://api.qrserver.com/v1/create-qr-code/?size=55x55&data=https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/24213)
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.