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A defect-tolerant memory architecture for molecular electronics

Authors
Lee, MHKim, YKChoi, YH
Issue Date
Mar-2004
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
crossbar; defect tolerance; memory; molecular electronics
Citation
IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.3, no.1, pp.152 - 157
Journal Title
IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume
3
Number
1
Start Page
152
End Page
157
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25790
DOI
10.1109/TNANO.2004.824011
ISSN
1536-125X
Abstract
This paper presents a defect-tolerant memory architecture for molecular electronics. A crossbar structure, where molecules are sandwiched between nanowires, is used as a model to realize molecular memory and to achieve defect tolerance. Defects in the logic circuits for addressing memory are also taken into account. The number of spare rows and columns to form a functioning memory is estimated by computer simulation for various values of defect rate and memory size.
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