Characteristics of pentacene-based thin-film transistors
- Authors
- Park, JH; Kang, CH; Kim, YJ; Lee, YS; Choi, JS
- Issue Date
- 5-Jan-2004
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- pentacene; organic TFTs; capacitance-voltage; MIS
- Citation
- MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, v.24, no.1-2, pp.27 - 29
- Journal Title
- MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS
- Volume
- 24
- Number
- 1-2
- Start Page
- 27
- End Page
- 29
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25806
- DOI
- 10.1016/j.msec.2003.09.064
- ISSN
- 0928-4931
- Abstract
- Pentacene was used as an active layer of organic thin-film transistors (TFTs) by depositing with the vacuum thermal evaporation. It is revealed that the deposition rate of pentacene may have critical effects on the electrical properties of pentacene-based TFTs. For the device fabrication, pentacene layers were deposited at a rate of 0.5, 1.0 and 2.5 Angstrom/s. Upon the investigations, TFT with the pentacene layer deposited at a rate of 2.5 Angstrom/s showed the most superior properties. The field-effect mobility of 0.16 cm(2)/V s, and the on/off current ratio of 10(5) were obtained at a drain voltage of -30 V To study the correlation between the deposition rate and the device performance, the capacitance properties were also measured in the metal/insulator/organic semiconductor (MIS) structure device by employing the capacitance-voltage (C-V) measurements. The lowest capacitance value was observed in the device with the pentacene layer deposited at a rate of 2.5 Angstrom/s. (C) 2003 Elsevier B.V. All rights reserved.
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