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Temperature dependent electrical properties in ITO/TPD/Alq(3)/Al organic light-emitting diodes

Authors
Kim, SKChung, DHLee, HSCho, HNPark, JWHong, JWKim, TW
Issue Date
4-Apr-2003
Publisher
ELSEVIER SCIENCE SA
Keywords
organic light-emitting diodes; conduction mechanism; hopping model; Fowler-Nordheim tunneling
Citation
SYNTHETIC METALS, v.137, no.1-3, pp.1041 - 1042
Journal Title
SYNTHETIC METALS
Volume
137
Number
1-3
Start Page
1041
End Page
1042
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25986
DOI
10.1016/S0379-6779(02)00895-0
ISSN
0379-6779
Abstract
Temperature dependence of current-voltage-luminance characteristics in organic light-emitting diodes are studied in a device structure of ITO/TPD/Alq(3)/Al to understand an electrical conduction mechanism. The current-voltage-luminance characteristics are measured in the temperature range of 8Ksimilar to300K, and analyzed them using a hopping model with exponential trap distribution and Fowler-Nordheim tunneling. At low temperatures below 150K, the Fowler-Nordheim tunneling conduction mechanism is dominant. And we have obtained a zero field barrier height to be about 0.6similar to0.8eV
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