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Fabrication of Rhodium Coated Ni-Co Microelectromechanical Systems Probe Tips Using Electroplating Method

Authors
Kang, Na-YoungLee, Seo-HyangLee, Jae-Ho
Issue Date
Aug-2021
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Rhodium; Pulse Current Electroplating; MEMS Probe Card Tips; Residual Stress; Heat Treatment
Citation
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, v.16, no.8, pp.1303 - 1307
Journal Title
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS
Volume
16
Number
8
Start Page
1303
End Page
1307
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/27810
DOI
10.1166/jno.2021.3023
ISSN
1555-130X
Abstract
Rhodium (Rh) was electroplated at various conditions for wear-resistant probe card tips to improve perfor-mance and durability. When direct current (DC) was applied for the electroplating, the cracks were developed on the electrodeposited Rh due to the high residual stress. Pulse current (PC) method was applied to reduce cracks. Two conditions of on:off were applied and the crack free surfaces were obtained. The surface hard-ness of the deposits was over HV 800, it is 60% higher than that of Ni-Co deposits. To secure the thermal stability at high temperature, heat treatments were conducted at 300 degrees C. The addition of additives such as sul-famic acid and sodium dodecyl sulfate (SDS) can improve the ductility of Rh/Ni-Co deposits to overcome the difference of coefficient of thermal expansion (CTE) between the electrodeposits and the substrate. Finally, crack free Rh coated Ni-Co probe tips were fabricated using PC with addition of additives.
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