Shear strength and aging characteristics of Sn-Pb and Sn-Ag-Bi solder bumps
- Authors
- Choi, JW; Oh, TS
- Issue Date
- 2001
- Publisher
- IEEE
- Citation
- ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001, pp.433 - 437
- Journal Title
- ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001
- Start Page
- 433
- End Page
- 437
- URI
- https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/28021
- DOI
- 10.1109/EMAP.2001.984023
- Abstract
- Ball shear strength and aging charcteristics of the 63Sn-37Pb solder bumps were characterized with variations of UBM finish (Au/Ni/Cu and Ni/Cu) and solder ball size (0.35 to 0.76 mm). Also, tensile strength, ball shear strength, and aging characteristics of the Sn-3.5Ag-Bi solder alloys were investigated. When formed on Au/Ni/Cu UBM, ball shear strength of the 63Sn-37Pb solder bumps of 0.35 mm size was higher than those of the 0.62 and 0.76 mm sizes due to precipication hardening of Au-Sn intermetallic compounds. When the bump size was identical, the 63Sn-37Pb solder bumps exhibited higher shear strength on Au/Ni/Cu UBM than on Ni/Cu UBM. Shear strength of the 63Sn-37Pb solder bumps formed on Ni/Cu UBM was little varied with aging at 150degreesC up to 1000 hours. With increasing the aging time, the failure mode of the 63Sn-37Pb solder bumps on Au/Ni/Cu UBM was changed from ductile fracture (solder failure) to brittle fracture (interface failure). The 63Sn-37Pb solder bumps on Ni/Cu UBM showed ductile fracture regardless of the aging time up to 1000 hours. Tensile strength of the Sn-3.5Ag-Bi alloys increased with increasing the Bi content up to 9 wt%. Ball shear strength of the Sn-3.5Ag-Bi solder bumps increased with increasing the Bi content and reached maximum at 5-7 wt% Bi. Shear strength of the Sn-3.5Ag-5Bi solder bumps increased substatially from 70 MPa to 84 MPa by aging at 150degreesC for 300 hours.
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Collections - College of Engineering > Materials Science and Engineering Major > 1. Journal Articles
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