Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Shear strength and aging characteristics of Sn-Pb and Sn-Ag-Bi solder bumps

Authors
Choi, JWOh, TS
Issue Date
2001
Publisher
IEEE
Citation
ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001, pp.433 - 437
Journal Title
ADVANCES IN ELECTRONIC MATERIALS AND PACKAGING 2001
Start Page
433
End Page
437
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/28021
DOI
10.1109/EMAP.2001.984023
Abstract
Ball shear strength and aging charcteristics of the 63Sn-37Pb solder bumps were characterized with variations of UBM finish (Au/Ni/Cu and Ni/Cu) and solder ball size (0.35 to 0.76 mm). Also, tensile strength, ball shear strength, and aging characteristics of the Sn-3.5Ag-Bi solder alloys were investigated. When formed on Au/Ni/Cu UBM, ball shear strength of the 63Sn-37Pb solder bumps of 0.35 mm size was higher than those of the 0.62 and 0.76 mm sizes due to precipication hardening of Au-Sn intermetallic compounds. When the bump size was identical, the 63Sn-37Pb solder bumps exhibited higher shear strength on Au/Ni/Cu UBM than on Ni/Cu UBM. Shear strength of the 63Sn-37Pb solder bumps formed on Ni/Cu UBM was little varied with aging at 150degreesC up to 1000 hours. With increasing the aging time, the failure mode of the 63Sn-37Pb solder bumps on Au/Ni/Cu UBM was changed from ductile fracture (solder failure) to brittle fracture (interface failure). The 63Sn-37Pb solder bumps on Ni/Cu UBM showed ductile fracture regardless of the aging time up to 1000 hours. Tensile strength of the Sn-3.5Ag-Bi alloys increased with increasing the Bi content up to 9 wt%. Ball shear strength of the Sn-3.5Ag-Bi solder bumps increased with increasing the Bi content and reached maximum at 5-7 wt% Bi. Shear strength of the Sn-3.5Ag-5Bi solder bumps increased substatially from 70 MPa to 84 MPa by aging at 150degreesC for 300 hours.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Materials Science and Engineering Major > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE