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Inverse Relationship between Exo-Electron Currents and Statistical Delay of AC PDPs
- Authors
- Kuang, Yawei; Choi, Keun-Ho; Kim, Yong-Seog
- Issue Date
- 2010
- Publisher
- INST IMAGE INFORMATION & TELEVISION ENGINEERS
- Citation
- IDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, pp.961 - 962
- Start Page
- 961
- End Page
- 962
- ISSN
- 1883-2490
- Abstract
- A relationship between exo-electron current and statistical relationship was examined on AC PDP test panels with or without MgO nano-crystals sprayed on MgO layer. The results indicated that the statistical delay is inversely proportional to exo-electron currents, but its proportional constant varies significantly, depending on the presence of MgO nano-crystals.
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