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Threshold condition for micro-ring cavity lasers with waveguide self-aligned total internal reflectors
- Issue Date
- 2005
- Publisher
- IEEE
- Keywords
- micro-ring cavity; self-aligned mirror; total internal reflector
- Citation
- CAOL 2005: PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON ADVANCED OPTOELECTRONICS AND LASERS, VOL 1, pp.190 - 193
- Journal Title
- CAOL 2005: PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON ADVANCED OPTOELECTRONICS AND LASERS, VOL 1
- Start Page
- 190
- End Page
- 193
- ISSN
- 2160-1518
- Abstract
- In this paper, the lasing characteristics of waveguide micro-ring cavity devices utilizing self-aligned total internal reflectors were analyzed by using a finite-difference time domain (FDTD) method and a transfer-matrix method (TMM). The simulation algorithm utilized a 2D FDTD combined with effective index method to analyze the total internal reflectors fabricated by the self-aligned SiN masks for RIE and re-growth. The whole micro-ring cavity performance was analyzed by using a TMM incorporating the device parameters extracted from the FDTD analysis. The simulation results were compared with the experimental results, which showed a good agreement.
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Related Researcher
- Yi, Jong Chang
- Engineering (Electronic & Electrical Engineering)