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Data extraction from flash memory and reverse engineering using Xilinx 7 series FPGA boards

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dc.contributor.authorLee, D.-
dc.contributor.authorLee, S.-
dc.contributor.authorCho, M.-
dc.contributor.authorLee, H.-M.-
dc.contributor.authorKim, Y.-
dc.date.accessioned2023-02-28T01:43:11Z-
dc.date.available2023-02-28T01:43:11Z-
dc.date.created2023-02-28-
dc.date.issued2022-01-01-
dc.identifier.issn0000-0000-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/30880-
dc.description.abstractIn this paper, we introduce a general methodology of reverse engineering for Xilinx FPGA devices using flash memory for programming. Based on the structural analysis of the flash memory used for the most recent 7-Series FPGA, data extraction for reverse engineering is carried out targeting the flash memory with the help of a logic analyzer. The accuracy of the extracted bitstream is finally verified using the in-house reverse engineering tool. © 2022 IEEE.-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleData extraction from flash memory and reverse engineering using Xilinx 7 series FPGA boards-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Y.-
dc.identifier.doi10.1109/ISOCC56007.2022.10031296-
dc.identifier.scopusid2-s2.0-85148444108-
dc.identifier.wosid000971297000158-
dc.identifier.bibliographicCitationProceedings - International SoC Design Conference 2022, ISOCC 2022, pp.330 - 331-
dc.relation.isPartOfProceedings - International SoC Design Conference 2022, ISOCC 2022-
dc.citation.titleProceedings - International SoC Design Conference 2022, ISOCC 2022-
dc.citation.startPage330-
dc.citation.endPage331-
dc.type.rimsART-
dc.type.docTypeProceedings Paper-
dc.description.journalClass1-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryComputer Science, Theory & Methods-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordAuthorbitstream-
dc.subject.keywordAuthorflash memory-
dc.subject.keywordAuthorFPGA-
dc.subject.keywordAuthorlogic analyzer-
dc.subject.keywordAuthorReverse Engineering-
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