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Facile one-pot iodine gas phase doping on 2D MoS2/CuS FET at room temperature

Authors
Pak, S.Son, J.Kim, T.Lim, J.Hong, J.Lim, Y.Heo, C.-J.Park, K.-B.Jin, Y.W.Park, K.-H.Cho, Y.Cha, S.
Issue Date
1-Jan-2023
Publisher
NLM (Medline)
Keywords
CuS contact; iodine doping; MoS2 monolayer; one pot doping; P-type doping
Citation
Nanotechnology, v.34, no.1
Journal Title
Nanotechnology
Volume
34
Number
1
URI
https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/32950
DOI
10.1088/1361-6528/ac952f
ISSN
0957-4484
1361-6528
Abstract
Electronic devices composed of semiconducting two-dimensional (2D) materials and ultrathin 2D metallic electrode materials, accompanying synergistic interactions and extraordinary properties, are becoming highly promising for future flexible and transparent electronic and optoelectronic device applications. Unlike devices with bulk metal electrode and 2D channel materials, devices with ultrathin 2D electrode and 2D channel are susceptible to chemical reactions in both channel and electrode surface due to the high surface to volume ratio of the 2D structures. However, so far, the effect of doping was primary concerned on the channel component, and there is lack of understanding in terms of how to modulate electrical properties of devices by engineering electrical properties of both the metallic electrode and the semiconducting channel. Here, we propose the novel, one-pot doping of the field-effect transistor (FET) based on 2D molybdenum disulfide (MoS2) channel and ultrathin copper sulfide (CuS) electrodes under mild iodine gas environment at room temperature, which simultaneously modulates electrical properties of the 2D MoS2channel and 2D CuS electrode in a facile and cost-effective way. After one-pot iodine doping, effective p-type doping of the channel and electrode was observed, which was shown through decreased off current level, improvedIon/Ioffratio and subthreshold swing value. Our results open up possibility for effectively and conveniently modulating electrical properties of FETs made of various 2D semiconductors and ultrathin contact materials without causing any detrimental damage. © 2022 IOP Publishing Ltd.
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