A Sensitivity-controllable Shear-stress Sensor with 2 Sets of+45/-45 Degree Semiconductor Resistor-sensor Pair
DC Field | Value | Language |
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dc.contributor.author | Cho, Chun-Hyung | - |
dc.contributor.author | Cha, Ho-Young | - |
dc.contributor.author | Sung, Hyuk-Kee | - |
dc.date.available | 2020-07-10T04:28:59Z | - |
dc.date.created | 2020-07-06 | - |
dc.date.issued | 2018-04 | - |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/3875 | - |
dc.description.abstract | In this paper, we investigated the most enhanced shear-stress sensor by using 2 mid-points measurements in a separate +/- 45 degrees semiconductor resistor-sensor pair. Compared to our latest works, we added an additional +/- 45 degrees semiconductor resistor-sensor pair upside down, and the sensitivity was observed to be significantly increased approximately by 100% (2 times) compared to the result for our latest work. Also, we validated our results analytically by error analysis in sensitivity. Furthermore, we proposed a simple and efficient measurement-technique for the shear-stress calculation in which we just needed to measure voltage between the midpoints without the need for calculating the voltage ratio in each resistor-sensor pair. By this technique, we could increase the shear-sensitivity by controlling the common applied voltage between the sensor pairs. As an example, for the applied voltage of 8V between the pair, the sensitivity showed a significant increase by 300 % (4 times). | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEK PUBLICATION CENTER | - |
dc.subject | SILICON | - |
dc.title | A Sensitivity-controllable Shear-stress Sensor with 2 Sets of+45/-45 Degree Semiconductor Resistor-sensor Pair | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Cho, Chun-Hyung | - |
dc.contributor.affiliatedAuthor | Cha, Ho-Young | - |
dc.contributor.affiliatedAuthor | Sung, Hyuk-Kee | - |
dc.identifier.doi | 10.5573/JSTS.2018.18.2.139 | - |
dc.identifier.scopusid | 2-s2.0-85046480269 | - |
dc.identifier.wosid | 000432340100003 | - |
dc.identifier.bibliographicCitation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.18, no.2, pp.139 - 145 | - |
dc.relation.isPartOf | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.citation.title | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.citation.volume | 18 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 139 | - |
dc.citation.endPage | 145 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.identifier.kciid | ART002338818 | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordAuthor | Semiconductor stress-sensor | - |
dc.subject.keywordAuthor | shear-stress | - |
dc.subject.keywordAuthor | sensitivity | - |
dc.subject.keywordAuthor | resistor sensor | - |
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