IEEE Journal of the Electron Devices Society 
Journal Title
- IEEE Journal of the Electron Devices Society
ISSN
- P 2168-6734 | 2168-6734
Publisher
- Institute of Electrical and Electronics Engineers Inc.
- IEEE
Listed on(Coverage)
| JCR | 2015-2019 |
|---|---|
| SJR | 2014-2019 |
| CiteScore | 2015-2019 |
| SCIE | 2015-2021 |
| CC | 2016-2021 |
| SCOPUS | 2017-2020 |
| DOAJ | 2017-2021 |
OA Info.
| OA |
based on the information
|
|---|---|
| Keywords | field effect transistors, logic gates, integrated circuit devices, display technologies, wearable devices |
| Review Process | Blind peer review |
| Journal info. pages | |
| Licences | CC BY, CC BY-NC-ND |
| Copyrights | Yes |
| DOAJ Coverage |
|
| Subject(s) | Technology: Electrical engineering. Electronics. Nuclear engineering |
Active
- Active
based on the information
- SCOPUS:2020-10
Country
- USA
Aime & Scopes
- The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC's, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original. All research papers benefit from rapid peer review and publication, and are deposited in IEEE Xplore.