ScholarWorks@Hongik: Journal : Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC

Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC

Journal Title

Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC

ISSN

1550-8781

Publisher

Listed on(Coverage)

SJR	2005-2017;2019
SCOPUS	2017

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Article List

1 - 2 out of 2 results.

Degradation characteristics of high-voltage AlGaN/GaN-on-Si heterostructure FETs under DC stress

Choi, S.; Lee, J.-G.; Yoon, H.; Cha, H.-Y.; Kim, H.

ArticleIssue Date2012CitationTechnical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC

Degradation Characteristics of high-voltage AlGaN/GaN-on-Si Heterostructure FETs under DC stress

Choi, Shinhyuk; Lee, Jae-Gil; Yoon, Hoonsang; Cha, Ho-Young; Kim, Hyungtak

ArticleIssue Date2012Citation2012 IEEE COMPOUND SEMICONDUCTOR INTEGRATED CIRCUIT SYMPOSIUM (CSICS)PublisherIEEE

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