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A study on the analysis of HBM and CDM electrostatic discharge phenomena in CMOS integrated circuitsA study on the analysis of HBM and CDM electrostatic discharge phenomena in CMOS integrated circuits
- Other Titles
- A study on the analysis of HBM and CDM electrostatic discharge phenomena in CMOS integrated circuits
- Authors
- Song, Kwang-soup
- Issue Date
- Feb-2002
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Collections - Department of Medical IT Convergence Engineering > 1. Journal Articles
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Related Researcher
- Song, Kwang Soup
- College of Engineering (Department of Medical IT Convergence Engineering)