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Test Case Generation for Context Testing of Embedded SystemsTest Case Generation for Context Testing of Embedded System
- Other Titles
- Test Case Generation for Context Testing of Embedded System
- Authors
- Kim, Tae-Hyong
- Issue Date
- Nov-2007
- Publisher
- IJCSNJ
- Citation
- International Journal of Computer Sciences and Network Security, v.7, no.11
- Journal Title
- International Journal of Computer Sciences and Network Security
- Volume
- 7
- Number
- 11
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