Son, S.[Son, S.]; Park, W.[Park, W.]; Lee, J.[Lee, J.]; Seung, W.[Seung, W.]; Lee, C.[Lee, C.]; Seol, B.[Seol, B.]; Park, T.[Park, T.]; Chun, J.-H.[Chun, J.-H.]
ArticleIssue Date2020CitationDigest of Technical Papers - SID International Symposium, v.51, no.1, pp.75 - 78PublisherBlackwell Publishing Ltd