Yoo, DG[Yoo, D. -G.]; Nam, SH[Nam, S. -H.]; Kim, MH[Kim, M. H.]; Jeong, SH[Jeong, S. H.]; Jee, HG[Jee, H. -G.]; Lee, HJ[Lee, H. J.]; Lee, NE[Lee, N. -E.]; Hong, BY[Hong, B. Y.]; Kim, YJ[Kim, Y. J.]; Jung, D[Jung, D.], et al.
ArticleIssue Date2008CitationSURFACE & COATINGS TECHNOLOGY, v.202, no.22-23, pp.5476 - 5479PublisherELSEVIER SCIENCE SA