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Recovery method of S/W failure induced by ESD using far-end crosstalk between PCB traces
- Issue Date
- 2017
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- Ear-end crosstalk; ESD coupling; ESD detection; S/W failure
- Citation
- 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017, pp.178 - 180
- Journal Title
- 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017
- Start Page
- 178
- End Page
- 180
- Abstract
- This paper proposes a new ESD detection circuit to reduce the ESD failure issues on printed circuit board (PCB). The proposed circuit uses the S/W failure recovery algorithm using the far-end crosstalk induced by ESD. To estimate the far-end crosstalk, we propose analytical equations that predict the crosstalk induced by ESD noise. The model captures the dependency of crosstalk as a function of PCB trace length and spacing between traces. The accuracy of the crosstalk equation was validated with EM simulation and measurement results. With this proposed circuit and algorithm, S/W failure issues caused by ESD were improved by 76% compared with previously used methods. © 2017 IEEE.
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Related Researcher
- KIM, SO YOUNG
- Information and Communication Engineering (Semiconductor Systems Engineering)