Voltage and Frequency Tuning Methodology for Near-Threshold Manycore Computing using Critical Path Delay Variation
- Authors
- Li C.-L.[Li C.-L.]; Kim H.J.[Kim H.J.]; Heo S.W.[Heo S.W.]; Han T.H.[Han T.H.]
- Issue Date
- Dec-2015
- Publisher
- 대한전자공학회
- Keywords
- Near-threshold computing; super-threshold computing; process variation; voltage and frequency tuning; multiple-voltage multiple-frequency
- Citation
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.15, no.6, pp.678 - 684
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Volume
- 15
- Number
- 6
- Start Page
- 678
- End Page
- 684
- URI
- https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/42276
- DOI
- 10.5573/JSTS.2015.15.6.678
- ISSN
- 1598-1657
- Abstract
- Near-threshold computing (NTC) is now regarded as a promising candidate for innovative power reduction, which cannot be achieved with conventional super-threshold computing (STC). However, performance degradation and vulnerability to process variation in the NTC regime are the primary concerns. In this paper, we propose a voltage-and frequency-tuning methodology for mitigating the process-variation-induced problems in NTC-based manycore architectures. To implement the proposed methodology, we build up multiple-voltage multiple-frequency (MVMF) islands and apply a voltage-frequency tuning algorithm based on the critical-path monitoring technique to reduce the effects of process variation and maximize energy efficiency in the post-silicon stage. Experimental results show that the proposed methodology reduces overall power consumption by 8.2-20.0%, compared to existing methods in variation-sensitive NTC environments.
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- Appears in
Collections - Information and Communication Engineering > Department of Semiconductor Systems Engineering > 1. Journal Articles
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