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EMI prediction in slew rate controlled switching I/O buffers

Authors
Kim N.[Kim N.]Kim N.[Kim N.]Hwang J.[Hwang J.]Kim J.[Kim J.]Kim S.[Kim S.]
Issue Date
2015
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
EMI; Far-field; I/O buffers; Slew rate
Citation
2013 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2013
Journal Title
2013 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2013
URI
https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/45404
DOI
10.1109/APEMC.2013.7360620
ISSN
0000-0000
Abstract
In this paper, modelling and co-simulation methodology is proposed to predict electromagnetic interference (EMI) from on-chip switching input/output buffers. The output waveforms of I/O buffers are simulated including on-chip I/O buffer circuit and RC extracted on-chip interconnect netlist, package, and printed circuit board (PCB). In order to accurately estimate the EMI, full-wave 3D simulator is used. The simulations results are compared with far-field measurements from anechoic chamber and near-field electromagnetic scan. The measurement and simulation results confirm the EMI can be reduced by controlling the slew rate of I/O buffers. © 2013 IEEE.
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