Yeom, H.[Yeom, H.]; Aida, K.[Aida, K.]; Choi, J.[Choi, J.]; Choi, Y.[Choi, Y.]; Deelman, E.[Deelman, E.]; Fiore, S.[Fiore, S.]; Diaz, R.G.[Diaz, R.G.]; Eom, H.[Eom, H.]; Heien, E.[Heien, E.]; Jensen, J.[Jensen, J.], et al.
ArticleIssue Date2019CitationProceedings - 2018 IEEE 3rd International Workshops on Foundations and Applications of Self* Systems, FAS*W 2018, pp.XIII - XIVPublisherInstitute of Electrical and Electronics Engineers Inc.