A closed-loop IGBT non-destructive tester
- Authors
- Ahmed, A.; Shadrokh, Y.; Coulbeck, L.; Castellazzi, A.; Johnson, C. M.
- Issue Date
- Sep-2012
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Citation
- MICROELECTRONICS RELIABILITY, v.52, no.9-10, pp.2358 - 2362
- Journal Title
- MICROELECTRONICS RELIABILITY
- Volume
- 52
- Number
- 9-10
- Start Page
- 2358
- End Page
- 2362
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/12356
- DOI
- 10.1016/j.microrel.2012.06.108
- ISSN
- 0026-2714
- Abstract
- Non-destructive testing capability is a very important aspect of power device technology evolution towards more robust and reliable products. This paper proposes a closed-loop non-destructive tester for high power multi-chip IGBT modules. Other than proposed elsewhere in the past, the solution put forward here includes the possibility to be used in closed-loop, by proper identification and monitoring of representative pre-failure signatures to automatically trigger the activation of a protective switch and prevent the failure of the device under test. The advantage is that devices of different characteristics (e.g., voltage range, type) can be tested without having to set a specific intervention delay for the protection circuit. (C) 2012 Elsevier Ltd. All rights reserved.
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Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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