A closed-loop IGBT non-destructive tester

Abstract

Non-destructive testing capability is a very important aspect of power device technology evolution towards more robust and reliable products. This paper proposes a closed-loop non-destructive tester for high power multi-chip IGBT modules. Other than proposed elsewhere in the past, the solution put forward here includes the possibility to be used in closed-loop, by proper identification and monitoring of representative pre-failure signatures to automatically trigger the activation of a protective switch and prevent the failure of the device under test. The advantage is that devices of different characteristics (e.g., voltage range, type) can be tested without having to set a specific intervention delay for the protection circuit. (C) 2012 Elsevier Ltd. All rights reserved.