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Optical characterization of thermally oxidized Ni films
- Authors
- Seo, Y. K.; Lee, D. J.; Koh, Y-D; Chung, J-S; Lee, Y. S.; Jo, Y.
- Issue Date
- 7-Jun-2009
- Publisher
- IOP PUBLISHING LTD
- Citation
- JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.42, no.11
- Journal Title
- JOURNAL OF PHYSICS D-APPLIED PHYSICS
- Volume
- 42
- Number
- 11
- ISSN
- 0022-3727
- Abstract
- We investigated the electronic properties of thermally oxidized Ni films using the optical spectroscopic technique and found that the optical properties of the NiO films exhibit systematic changes with oxidation degree in accord with structural and magnetic analysis results. We discuss our findings in relation to the doping to a Mott insulator and the inhomogeneous phase of a Ni(metal)-NiO(insulator) nano-composite.
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Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
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Related Researcher
- Lee, Yun Sang
- College of Natural Sciences (Department of Physics)