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Magnetic and thermal properties of MoN underlayer for spin valves depending on nitrogen concentration

Authors
Kim, J.Choi, Y.Jo, S.Kim, S. Y.Lee, C. W.
Issue Date
Oct-2006
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
diffusion barrier; GMR; IrMn; MoN films; spin valve; underlayer
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.42, no.10, pp.3267 - 3269
Journal Title
IEEE TRANSACTIONS ON MAGNETICS
Volume
42
Number
10
Start Page
3267
End Page
3269
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/18596
DOI
10.1109/TMAG.2006.879148
ISSN
0018-9464
Abstract
We incorporated nitrogen in the Mo underlayer and investigated the effect of nitrogen concentration on the magnetic properties and annealing behavior of the spin valve devices. The spin valve structure was Si/SiO2/Mo(MoN)(35 angstrom)/NiFe(21 angstrom)/CoFe(28 angstrom)/Cu(22 A)/CoFe(18 angstrom)/IrMn(65 angstrom)/Ta(25 angstrom). It is concluded that MoN underlayer is magnetically as good as Ta underlayer for N-2 gas flow rate of less than 6 sccm.
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