A study on insuring the full reliability of finite state machine
- Authors
- Yang, S; Kim, MJ; Park, JH; Chang, H
- Issue Date
- 2003
- Publisher
- SPRINGER-VERLAG BERLIN
- Citation
- COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2003, PT 2, PROCEEDINGS, v.2668, pp.656 - 663
- Journal Title
- COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2003, PT 2, PROCEEDINGS
- Volume
- 2668
- Start Page
- 656
- End Page
- 663
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/21117
- ISSN
- 0302-9743
- Abstract
- In this paper, an efficient non-scan design-for-testability (DFT) method for finite state machine(FSM) is proposed. The proposed method always guarantees short test pattern generation time and complete fault efficiency. It has a lower area overhead than full-scan and other non-scan DFT methods and enables to apply test patterns at-speed. The efficiency of the proposed method is demonstrated using well-known MCNC'91 FSM benchmark circuits.
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