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X-ray scattering study on the electric field-induced interfacial magnetic anisotropy modulation at CoFeB / MgO interfaces

Authors
Song, K.M.Kim, D.-O.Kim, J.-S.Lee, D.R.Choi, J.W.
Issue Date
May-2018
Publisher
Elsevier B.V.
Keywords
Spintronics; Magnetic anisotropy; X-ray scattering; Electric field control of magnetism
Citation
Current Applied Physics, v.18, no.11, pp.1212 - 1217
Journal Title
Current Applied Physics
Volume
18
Number
11
Start Page
1212
End Page
1217
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/31312
DOI
10.1016/j.cap.2018.05.003
ISSN
1567-1739
Abstract
The electric field-induced modifications of magnetic anisotropy in CoFeB/MgO systems are studied using X-ray resonant magnetic scattering and magneto-optical Kerr effect. Voltage dependent changes of the magnetic anisotropy of −12.7 fJ/Vm and −8.32 fJ/Vm are observed for Ta/CoFeB/MgO and Hf/CoFeB/MgO systems, respectively. This implies that the interfacial perpendicular magnetic anisotropy is reduced (enhanced) when electron density is increased (decreased). X-ray resonant magnetic scattering measurements reveal that the small in-plane magnetic component of the remanent state of CoFeB/MgO systems with weak magnetic anisotropy changes depending on the applied voltage leading to modification of the magnetic anisotropy at the CoFeB/MgO interface. © 2018 Korean Physical Society
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