Design of a K-Band High-Linearity Asymmetric SPDT CMOS Switch Using a Stacked Transistor
- Authors
- Kim, Taehun; Lee, Hui Dong; Park, Bonghyuk; Jang, Seunghyun; Kong, Sunwoo; Park, Changkun
- Issue Date
- Dec-2022
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Insertion loss; Loss measurement; Switching circuits; Transistors; Switches; Logic gates; Semiconductor device measurement; CMOS; high linearity; K-band; millimeter-wave (mm-wave); single-pole double-throw (SPDT); switch
- Citation
- IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.32, no.12, pp.1443 - 1446
- Journal Title
- IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
- Volume
- 32
- Number
- 12
- Start Page
- 1443
- End Page
- 1446
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/42977
- DOI
- 10.1109/LMWC.2022.3192440
- ISSN
- 1531-1309
- Abstract
- This study presents a high-linearity K-band single-pole double-throw (SPDT) switch with asymmetric topology in a 65-nm CMOS process for 5G applications. To simultaneously obtain high power-handling capability and high isolation in the Tx and Rx modes, respectively, we propose an SPDT switch using asymmetric topology and the stacked-transistor technique. In both the Tx/Rx modes, the proposed SPDT switch operates with an insertion loss of less than 2.1 dB and isolation better than 22.5 dB in the frequency range 20-25 GHz. At 22 GHz, the measurement results of the input 1-dB compression point (IP1dB) are 32.5 and 4.7 dBm in Tx and Rx modes, respectively. The chip core size of the proposed SPDT switch is 0.03 mm(2).
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