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Design of a K-Band High-Linearity Asymmetric SPDT CMOS Switch Using a Stacked Transistor

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dc.contributor.authorKim, Taehun-
dc.contributor.authorLee, Hui Dong-
dc.contributor.authorPark, Bonghyuk-
dc.contributor.authorJang, Seunghyun-
dc.contributor.authorKong, Sunwoo-
dc.contributor.authorPark, Changkun-
dc.date.accessioned2023-01-02T05:40:03Z-
dc.date.available2023-01-02T05:40:03Z-
dc.date.created2023-01-02-
dc.date.issued2022-12-
dc.identifier.issn1531-1309-
dc.identifier.urihttp://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/42977-
dc.description.abstractThis study presents a high-linearity K-band single-pole double-throw (SPDT) switch with asymmetric topology in a 65-nm CMOS process for 5G applications. To simultaneously obtain high power-handling capability and high isolation in the Tx and Rx modes, respectively, we propose an SPDT switch using asymmetric topology and the stacked-transistor technique. In both the Tx/Rx modes, the proposed SPDT switch operates with an insertion loss of less than 2.1 dB and isolation better than 22.5 dB in the frequency range 20-25 GHz. At 22 GHz, the measurement results of the input 1-dB compression point (IP1dB) are 32.5 and 4.7 dBm in Tx and Rx modes, respectively. The chip core size of the proposed SPDT switch is 0.03 mm(2).-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.relation.isPartOfIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS-
dc.titleDesign of a K-Band High-Linearity Asymmetric SPDT CMOS Switch Using a Stacked Transistor-
dc.typeArticle-
dc.identifier.doi10.1109/LMWC.2022.3192440-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.32, no.12, pp.1443 - 1446-
dc.description.journalClass1-
dc.identifier.wosid000833062000001-
dc.identifier.scopusid2-s2.0-85135762416-
dc.citation.endPage1446-
dc.citation.number12-
dc.citation.startPage1443-
dc.citation.titleIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS-
dc.citation.volume32-
dc.contributor.affiliatedAuthorPark, Changkun-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9844166-
dc.type.docTypeArticle; Early Access-
dc.description.isOpenAccessN-
dc.subject.keywordAuthorInsertion loss-
dc.subject.keywordAuthorLoss measurement-
dc.subject.keywordAuthorSwitching circuits-
dc.subject.keywordAuthorTransistors-
dc.subject.keywordAuthorSwitches-
dc.subject.keywordAuthorLogic gates-
dc.subject.keywordAuthorSemiconductor device measurement-
dc.subject.keywordAuthorCMOS-
dc.subject.keywordAuthorhigh linearity-
dc.subject.keywordAuthorK-band-
dc.subject.keywordAuthormillimeter-wave (mm-wave)-
dc.subject.keywordAuthorsingle-pole double-throw (SPDT)-
dc.subject.keywordAuthorswitch-
dc.subject.keywordPlusTRANSCEIVER-
dc.subject.keywordPlusPHASE-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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